Fundamentals of atomic force microscopy / Ronald Reifenberger (Purdue University, USA).
Material type: TextSeries: Lessons from nanoscience ; 4Description: xv , 324 p. ; 23 cmISBN:- 9789814630344 (v. 1 : hardcover : alk. paper)
- 9789814630351
- 538 REI 23
- QH212.A78 R45 2012
Incomplete contents:
part 1. Foundations
Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Books | School of Theoretical Physics Library | Books | 538 REI (Browse shelf(Opens below)) | Available | 11794 |
Includes bibliographical references and index.
part 1. Foundations
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