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Fundamentals of atomic force microscopy / Ronald Reifenberger (Purdue University, USA).

By: Material type: TextTextSeries: Lessons from nanoscience ; 4Description: xv , 324 p. ; 23 cmISBN:
  • 9789814630344 (v. 1 : hardcover : alk. paper)
  • 9789814630351
Subject(s): DDC classification:
  • 538 REI 23
LOC classification:
  • QH212.A78 R45 2012
Incomplete contents:
part 1. Foundations
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Holdings
Item type Current library Collection Call number Status Date due Barcode
Books Books School of Theoretical Physics Library Books 538 REI (Browse shelf(Opens below)) Available 11794

Includes bibliographical references and index.

part 1. Foundations

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